Description


Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables

Related CPE's

















































h

qualcomm

sm8475

2







































































































































Weaknesses



CWE-367

CVSS impact metrics


CVSS:3.1/AV:L/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

8.4 · High

Information


Source identifier

[email protected]

Vulnerability status

Modified

Published

2022-09-16T04:15:11.180Z

3 years ago

Last modified

2024-11-21T05:52:45.363Z

1 year ago